Photo-Excited Charge Collection Spectroscopy

Probing the traps in field-effect transistors
Author(s): Seongil Im,Youn-Gyoung Chang,Jae Hoon Kim
Read reviews
Loading Puzzle...
Success – Your message will goes here
We'd love to hear from you!
Thank you for visiting our website. Would you like to provide feedback on how we could improve your experience?