Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation, sample preparation, fundamental diffraction, imaging, analytical microscopy, and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.
Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.
This textbook entitled Fundamentals of Perovskite Oxides: Synthesis, Structure, Properties and Applications summarizes the structure, synthesis routes, and potential applications of perovskite oxide materials. Since these perovskite-type ceramic materials offer opportunities in a wide range of fields of science and engineering, the chapters are broadly organized into four sections of perovskite-type oxide materials and technology. Covers recent developments in perovskite oxides Serves as a quick reference of perovskite oxides information Describes novel synthesis routes for nanostructured perovskites Discusses comprehensive details for various crystal structures, synthesis methods, properties, and applications Applies to academic education, scientific research, and industrial R&D for materials research in real-world applications like bioengineering, catalysis, energy conversion, energy storage, environmental engineering, and data storage and sensing This book serves as a handy and practical guideline suitable for students, engineers, and researchers working with advanced ceramic materials.
This textbook entitled Fundamentals of Perovskite Oxides: Synthesis, Structure, Properties and Applications summarizes the structure, synthesis routes, and potential applications of perovskite oxide materials. Since these perovskite-type ceramic materials offer opportunities in a wide range of fields of science and engineering, the chapters are broadly organized into four sections of perovskite-type oxide materials and technology. Covers recent developments in perovskite oxides Serves as a quick reference of perovskite oxides information Describes novel synthesis routes for nanostructured perovskites Discusses comprehensive details for various crystal structures, synthesis methods, properties, and applications Applies to academic education, scientific research, and industrial R&D for materials research in real-world applications like bioengineering, catalysis, energy conversion, energy storage, environmental engineering, and data storage and sensing This book serves as a handy and practical guideline suitable for students, engineers, and researchers working with advanced ceramic materials.
Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation, sample preparation, fundamental diffraction, imaging, analytical microscopy, and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.
Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.
A Pragmatist and His Free Spirit portrays the unconventional love of Hu Shi, a Chinese social reformer and civil rights pioneer, and Edith Clifford Williams, an American avant-garde artist of the early twentieth century. Hu studied at Cornell University, where he first met Williams, and Columbia University, where he worked with the famous pragmatist John Dewey. At the time of his death in 1962, he and Williams had exchanged more than 300 letters that, along with poems and excerpts from Hu's diaries and documents (some of which have never before been translated into English) form the center of this book. In Williams, Hu found his intellectual match, a woman and fellow scholar who helped the reformer reconcile his independent scholarship with cultural tradition. Williams counciled Hu on the acceptance of an arranged marriage, and she influenced his pursuit of experimental vernacular poetry through an exposure to avant-garde art. In 1933, the two became lovers, although their romance would eventually dwindle. Nevertheless, Williams maintained a devoted and honest correspondence with Hu throughout his tumultuous life. Hu's work touched on virtually every crucial aspect of twentieth-century Chinese society, particularly Chinese liberalism and the use of vernacular Chinese. A Pragmatist and His Free Spirit explores the lesser-known side of this major philosopher while reconstructing his romance with Williams. Not only does the volume place Hu within the larger social, economic, and political context of his time, but it also provides readers with a multifaceted portrait of China's dramatic modern history. Hu Shi: Father of the Modern Chinese Renaissance*1891: Born in a suburb of Shanghai; 1962: Died in Taipei.* Married with three children.* Possibly the most documented life in modern China.* Earned a B.A. and M.A. at Cornell University; Earned a Ph.D. at Columbia University, where he studied with the famous pragmatist John Dewey.* Became a leading figure of the Chinese Literary Revolution of 1919, advocating the use of vernacular Chinese and the importance of intellectual individualism.* Become a civil rights advocate who promoted the empowerment of women.* Served as the Republic of China's Ambassador to the United States from 1938 to 1942.* Installed as president of Peking University from 1946 to 1948.* Worked as curator of Princeton University's Gest Library from 1950 to 1952.* Became the target in absentia of a massive political denunciation campaign launched by the Chinese government between 1954 and 1955.* Served as president of Academica Sinica, Taipei, from 1958 to 1962.* Quoted as saying: "Be bold in your hypothesis; be meticulous in your verification." Edith Clifford Williams: A Woman Ahead of Her Time* 1885: Born in Ithaca, New York; 1971: Died in Barbados.* Claims to have followed her father's advice: "Don't marry unless you can't help it."* Studied at Yale University School of Art and the Académie Julian in Paris.* Became a pioneer of abstract art and a member of Alfred Stieglitz's inner circle.* Worked as the first full-time librarian of Cornell University's Veterinary Library from 1923 to 1946.* Completed two modernist works of monumental importance: Two Rhythms (1916), a painting now housed at the Philadelphia Museum of Art; and Plâtre à toucher chez de Zayas (1916), a sculpture made for touching that was featured in Marcel Duchamp's 1917 journal, Rongwrong, and used as the subject of a lecture by Guillaume Apollinaire in Paris.
This book is suitable for front-line personnel engaged in the design, construction and maintenance of tramway track engineering as a technical reference, and also provides theoretical reference for researchers in related fields.
The multi-billion-dollar microsystem packaging business continues to play an increasingly important technical role in today’s information industry. The packaging process—including design and manufacturing technologies—is the technical foundation upon which function chips are updated for use in application systems, and it is an important guarantee of the continued growth of technical content and value of information systems. Introduction to Microsystem Packaging Technology details the latest advances in this vital area, which involves microelectronics, optoelectronics, RF and wireless, MEMS, and related packaging and assembling technologies. It is purposefully written so that each chapter is relatively independent and the book systematically presents the widest possible overview of packaging knowledge. Elucidates the evolving world of packaging technologies for manufacturing The authors begin by introducing the fundamentals, history, and technical challenges of microsystems. Addressing an array of design techniques for packaging and integration, they cover substrate and interconnection technologies, examples of device- and system-level packaging, and various MEMS packaging techniques. The book also discusses module assembly and optoelectronic packaging, reliability methodologies and analysis, and prospects for the evolution and future applications of microsystems packaging and associated environmental protection. With its research examples and targeted reference questions and answers to reinforce understanding, this text is ideal for researchers, engineers, and students involved in microelectronics and MEMS. It is also useful to those who are not directly engaged in packaging but require a solid understanding of the field and its associated technologies.
This SpringerBrief examines the use of cheap commercial passive RFID tags to achieve accurate device-free object-tracking. It presents a sensitive detector, named Twins, which uses a pair of adjacent passive tags to detect uncooperative targets (such as intruders). Twins leverages a newly observed phenomenon called critical state that is caused by interference among passive tags. The author expands on the previous object tracking methods, which are mostly device-based, and reveals a new interference model and their extensive experiments for validation. A prototype implementation of the Twins-based intrusion detection scheme with commercial off-the-shelf reader and tags is also covered in this SpringerBrief. Device-Free Object Tracking Using Passive Tags is designed for researchers and professionals interested in smart sensing, localization, RFID and Internet of Things applications. The content is also useful for advanced-level students studying electrical engineering and computer science.
Professor Zhiping Liang offers a new understanding of Chinese legal tradition in this profoundly influential book. Unlike the available literature using the usual method of legal history research, this book attempts to illustrate ancient Chinese legal tradition through cultural interpretation. The author holds that both the concept and practice of law are meaningful cultural symbols. The law reveals not only the life pattern in a specific time and space but also the world of the mind of a specific group of people. Therefore, just as cultures have different types, laws embedded in different societies and cultures also have different characters and spirits. Believing that human experience is often condensed into concepts, categories, and classifications, the author begins his discussion with the analysis of relevant terms and then seeks to understand history by interpreting the interaction and interconnectedness of the words, ideas, and practices. Based on the same understanding, the author uses modern concepts reflectively and critically, consciously exploiting the differences between ancient and contemporary Chinese and Western concepts to achieve a more realistic understanding of history while avoiding the ethnocentrism and modern-centrism common in historical studies.
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