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Circadian Rhythms for Future Resilient Electronic Systems

Accelerated Active Self-Healing for Integrated Circuits

By: Xinfei Guo,Mircea R. Stan

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Circadian Rhythms for Future Resilient Electronic Systems

Accelerated Active Self-Healing for Integrated Circuits

By: Xinfei Guo,Mircea R. Stan

This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT.

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Page Count

215

Publisher

Springer

Published Date

ISBN 10

3030200515

ISBN 13

9783030200510

Circadian Rhythms for Future Resilient Electronic Systems

Accelerated Active Self-Healing for Integrated Circuits

By: Xinfei Guo,Mircea R. Stan

Write a review Read reviews Take a Quiz Solve Book Puzzle

Circadian Rhythms for Future Resilient Electronic Systems

Accelerated Active Self-Healing for Integrated Circuits

By: Xinfei Guo,Mircea R. Stan

This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT.

Average ratings

N/A

5

0%

4

0%

3

0%

2

0%

1

0%

Solve jigsaw puzzle

Age

Page Count

215

Publisher

Springer

Published Date

ISBN 10

3030200515

ISBN 13

9783030200510