William Q. Meeker's Books

Statistical Intervals

A Guide for Practitioners and Researchers

By: William Q. Meeker,Gerald J. Hahn,Luis A. Escobar

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Statistical Intervals

A Guide for Practitioners and Researchers

By: William Q. Meeker,Gerald J. Hahn,Luis A. Escobar

Describes statistical intervals to quantify sampling uncertainty,focusing on key application needs and recently developed methodology in an easy-to-apply format Statistical intervals provide invaluable tools for quantifying sampling uncertainty. The widely hailed first edition, published in 1991, described the use and construction of the most important statistical intervals. Particular emphasis was given to intervals—such as prediction intervals, tolerance intervals and confidence intervals on distribution quantiles—frequently needed in practice, but often neglected in introductory courses. Vastly improved computer capabilities over the past 25 years have resulted in an explosion of the tools readily available to analysts. This second edition—more than double the size of the first—adds these new methods in an easy-to-apply format. In addition to extensive updating of the original chapters, the second edition includes new chapters on: Likelihood-based statistical intervals Nonparametric bootstrap intervals Parametric bootstrap and other simulation-based intervals An introduction to Bayesian intervals Bayesian intervals for the popular binomial, Poisson and normal distributions Statistical intervals for Bayesian hierarchical models Advanced case studies, further illustrating the use of the newly described methods New technical appendices provide justification of the methods and pathways to extensions and further applications. A webpage directs readers to current readily accessible computer software and other useful information. Statistical Intervals: A Guide for Practitioners and Researchers, Second Edition is an up-to-date working guide and reference for all who analyze data, allowing them to quantify the uncertainty in their results using statistical intervals.

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Page Count

648

Publisher

John Wiley & Sons

Published Date

ISBN 10

1118594959

ISBN 13

9781118594957

Statistical Methods for Reliability Data

By: William Q. Meeker,Luis A. Escobar,Francis G. Pascual

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Statistical Methods for Reliability Data

By: William Q. Meeker,Luis A. Escobar,Francis G. Pascual

An authoritative guide to the most recent advances in statistical methods for quantifying reliability Statistical Methods for Reliability Data, Second Edition (SMRD2) is an essential guide to the most widely used and recently developed statistical methods for reliability data analysis and reliability test planning. Written by three experts in the area, SMRD2 updates and extends the long- established statistical techniques and shows how to apply powerful graphical, numerical, and simulation-based methods to a range of applications in reliability. SMRD2 is a comprehensive resource that describes maximum likelihood and Bayesian methods for solving practical problems that arise in product reliability and similar areas of application. SMRD2 illustrates methods with numerous applications and all the data sets are available on the book’s website. Also, SMRD2 contains an extensive collection of exercises that will enhance its use as a course textbook. The SMRD2's website contains valuable resources, including R packages, Stan model codes, presentation slides, technical notes, information about commercial software for reliability data analysis, and csv files for the 93 data sets used in the book's examples and exercises. The importance of statistical methods in the area of engineering reliability continues to grow and SMRD2 offers an updated guide for, exploring, modeling, and drawing conclusions from reliability data. SMRD2 features: Contains a wealth of information on modern methods and techniques for reliability data analysis Offers discussions on the practical problem-solving power of various Bayesian inference methods Provides examples of Bayesian data analysis performed using the R interface to the Stan system based on Stan models that are available on the book's website Includes helpful technical-problem and data-analysis exercise sets at the end of every chapter Presents illustrative computer graphics that highlight data, results of analyses, and technical concepts Written for engineers and statisticians in industry and academia, Statistical Methods for Reliability Data, Second Edition offers an authoritative guide to this important topic.

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Page Count

708

Publisher

John Wiley & Sons

Published Date

ISBN 10

1118594487

ISBN 13

9781118594483

Statistical Intervals

A Guide for Practitioners

By: Gerald J. Hahn,William Q. Meeker

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Statistical Intervals

A Guide for Practitioners

By: Gerald J. Hahn,William Q. Meeker

Presents a detailed exposition of statistical intervals and emphasizes applications in industry. The discussion differentiates at an elementary level among different kinds of statistical intervals and gives instruction with numerous examples and simple math on how to construct such intervals from sample data. This includes confidence intervals to contain a population percentile, confidence intervals on probability of meeting specified threshold value, and prediction intervals to include observation in a future sample. Also has an appendix containing computer subroutines for nonparametric statistical intervals.

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Page Count

423

Publisher

John Wiley & Sons

Published Date

ISBN 10

0470317442

ISBN 13

9780470317440

Applied Statistical Methods

For Business, Economics, and the Social Sciences

By: William Lee Carlson,Betty Thorne

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Applied Statistical Methods

For Business, Economics, and the Social Sciences

By: William Lee Carlson,Betty Thorne

This book describes and explains the entire process of designing and building a distributed object application with the VisualAge Smalltalk Distributed feature. This book contains an overview of the features and architecture of SmallTalk's Distributed feature; sample application components with supporting documentation to illustrate design and coding; and recommendations for building distributed object applications with VisualAge. Learn how to set up the development environment, and special considerations for testing, run-time configurations, optimization and performance tuning. For software development managers, designers and others planning to develop client/server and peer-to-peer applications with distributed objects using VisualAge.

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1074

Published Date

ISBN 10

0135708478

ISBN 13

9780135708477

Achieving Product Reliability

A Key to Business Success

By: Necip Doganaksoy,William Q. Meeker,Gerald J. Hahn

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Achieving Product Reliability

A Key to Business Success

By: Necip Doganaksoy,William Q. Meeker,Gerald J. Hahn

Are you buying a car or smartphone or dishwasher? We bet long-term, trouble-free operation (i.e., high reliability) is among the top three things you look for. Reliability problems can lead to everything from minor inconveniences to human disasters. Ensuring high reliability in designing and building manufactured products is principally an engineering challenge-but statistics plays a key role. Achieving Product Reliability explains in a non-technical manner how statistics is used in modern product reliability assurance. Features: Describes applications of statistics in reliability assurance in design, development, validation, manufacturing, and field tracking. Uses real-life examples to illustrate key statistical concepts such as the Weibull and lognormal distributions, hazard rate, and censored data. Demonstrates the use of graphical tools in such areas as accelerated testing, degradation data modeling, and repairable systems data analysis. Presents opportunities for profitably applying statistics in the era of Big Data and Industrial Internet of Things (IIoT) utilizing, for example, the instantaneous transmission of large quantities of field data. Whether you are an intellectually curious citizen, student, manager, budding reliability professional, or academician seeking practical applications, Achieving Product Reliability is a great starting point for a big-picture view of statistics in reliability assurance. The authors are world-renowned experts on this topic with extensive experience as company-wide statistical resources for a global conglomerate, consultants to business and government, and researchers of statistical methods for reliability applications. Dr. Necip Doganaksoy is an associate professor at the School of Business of Siena College, following a 26-year career in industry, mostly at General Electric (GE). Dr. William Q. Meeker is a professor of statistics and distinguished professor of liberal arts and sciences at Iowa State University and a frequent consultant to industry. Dr. Gerald J. Hahn is a retired manager of statistics at GE Global Research after a 46-year career at GE. All three authors are Fellows of the American Society for Quality and the American Statistical Association, elected members of the International Statistical Institute, authors of three or more books, and recipients of numerous prestigious professional awards"--

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Page Count

224

Publisher

CRC Press

Published Date

ISBN 10

1003181368

ISBN 13

9781003181361

Book's by William Q. Meeker

Statistical Intervals

Statistical Intervals

Statistical Methods for Reliability Data

Statistical Methods for Reliability Data

Statistical Intervals

Statistical Intervals

Applied Statistical Methods

Applied Statistical Methods

Achieving Product Reliability

Achieving Product Reliability

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