This book first provides readers with an introduction to the underlying physics and state-of-the-art application of photon counting detectors for X-ray imaging. The authors explain that a photon-counting imaging detector can realize quantitative analysis because the detector can derive X-ray attenuation information based on the analysis of intensity changes of individual X-ray. To realize this analysis, it is important to consider the physics of an object and detector material. In this book, the authors introduce a novel analytical procedure to create quantitative X-ray images for medical diagnosis.
This book first provides readers with an introduction to the underlying physics and state-of-the-art application of photon counting detectors for X-ray imaging. The authors explain that a photon-counting imaging detector can realize quantitative analysis because the detector can derive X-ray attenuation information based on the analysis of intensity changes of individual X-ray. To realize this analysis, it is important to consider the physics of an object and detector material. In this book, the authors introduce a novel analytical procedure to create quantitative X-ray images for medical diagnosis.
Explores the science and technology of lithographic processes and resist materials and summarizes the most recent innovations in semiconductor manufacturing. Considers future trends in lithography and resist material technology. Reviews the interaction of light, electron beams, and X-rays with resist materials.
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