This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.
Using a qualitative, interview-based approach, Kim investigates how conflicting identities and social marginalization affect the mental health of members of the ethnic Korean minority living in Japan. So-called “Zainichi” Koreans living in Japan have a higher suicide rate than native Japanese, or than any other ethnic group within Japan, a country which has one of the highest suicide rates in the world. Considering themselves neither truly Korean nor wholly Japanese, they are mainly descendants of immigrants who came to Japan during the colonial period in the late 19th and early 20th centuries. Kim explores the challenges facing these individuals, including the dilemmas of ethnic education, the discrimination against them by mainstream society, and the consequent impacts on their mental health. An insightful read both for scholars of Japanese culture and society and for anthropologists and sociologists with an interest in the effects of marginalization on ethnic minority citizens more broadly.
This book provides an accessible introduction to the variational formulation of Lagrangian and Hamiltonian mechanics, with a novel emphasis on global descriptions of the dynamics, which is a significant conceptual departure from more traditional approaches based on the use of local coordinates on the configuration manifold. In particular, we introduce a general methodology for obtaining globally valid equations of motion on configuration manifolds that are Lie groups, homogeneous spaces, and embedded manifolds, thereby avoiding the difficulties associated with coordinate singularities. The material is presented in an approachable fashion by considering concrete configuration manifolds of increasing complexity, which then motivates and naturally leads to the more general formulation that follows. Understanding of the material is enhanced by numerous in-depth examples throughout the book, culminating in non-trivial applications involving multi-body systems. This book is written for a general audience of mathematicians, engineers, and physicists with a basic knowledge of mechanics. Some basic background in differential geometry is helpful, but not essential, as the relevant concepts are introduced in the book, thereby making the material accessible to a broad audience, and suitable for either self-study or as the basis for a graduate course in applied mathematics, engineering, or physics.
Using a qualitative, interview-based approach, Kim investigates how conflicting identities and social marginalization affect the mental health of members of the ethnic Korean minority living in Japan. So-called “Zainichi” Koreans living in Japan have a higher suicide rate than native Japanese, or than any other ethnic group within Japan, a country which has one of the highest suicide rates in the world. Considering themselves neither truly Korean nor wholly Japanese, they are mainly descendants of immigrants who came to Japan during the colonial period in the late 19th and early 20th centuries. Kim explores the challenges facing these individuals, including the dilemmas of ethnic education, the discrimination against them by mainstream society, and the consequent impacts on their mental health. An insightful read both for scholars of Japanese culture and society and for anthropologists and sociologists with an interest in the effects of marginalization on ethnic minority citizens more broadly.
This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.
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