In wireless ad hoc networks, most of the authentication protocols assume a single source of trust. However, in the presence of multiple trust sources (called source group in this chapter), it becomes difficult to design resource- (or energy-) efficient authentication protocols, especially for multicast/broadcast services, utilizing multiple trust sources at the same time. Some traditional authentication approaches may be extended and used for this purpose. However, the communication overhead, for example, may increase significantly in proportion to the number of trust sources. In this chapter, we propose a new scheme named as Multi-Source Authentication with Split-Join One-Way Key Chain (SOKC). In this new technique, the communication overhead is small and constant, and the memory requirement at the verifier node is also minimal. The source group node needs to store n keys, where n represents the key chain length, which may be a reasonable requirement considering that the trust sources usually have more resources compared to other regular node(s) in the network (e.g., base stations in wireless sensor networks).
This book introduces microelectromechanical systems (MEMS) packaging utilizing polymers or thin films – a new and unique packaging technology. It first investigates the relationship between applied load and opening displacement as a function of benzocyclobutene (BCB) cap size to find the debonding behavior, and then presents BCB cap deformation and stress development at different opening displacements as a function of BCB thickness, which is a criterion for BCB cap transfer failure. Transfer packaging techniques are attracting increasing interest because they deliver packaging caps, from carrier wafers to device wafers, and minimize the fabrication issues frequently encountered in thin-film or polymer cap encapsulation. The book describes very-low-loss polymer cap or thin-film-transfer techniques based on anti-adhesion coating methods for radio frequency (RF) (-MEMS) device packaging. Since the polymer caps are susceptible to deformation due to their relatively low mechanical stiffness during debonding of the carrier wafer, the book develops an appropriate finite element model (FEM) to simulate the debonding process occurring in the interface between Si carrier wafer and BCB cap. Lastly, it includes the load–displacement curve of different materials and presents a flexible polymer filter and a tunable filter as examples of the applications of the proposed technology.
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