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Transient Electromagnetic-Thermal Nondestructive Testing

Pulsed Eddy Current and Transient Eddy Current Thermography

By: Yunze He,Bin Gao,Ali Sophian,Ruizhen Yang

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Transient Electromagnetic-Thermal Nondestructive Testing

Pulsed Eddy Current and Transient Eddy Current Thermography

By: Yunze He,Bin Gao,Ali Sophian,Ruizhen Yang

Transient Electromagnetic-Thermal Nondestructive Testing: Pulsed Eddy Current and Transient Eddy Current Thermography covers three key areas of theories, methods and applications, primarily the multi-physics field, including eddy current, heat conduction and Infrared radiation for defect evaluation, lateral heat conduction, which is analyzed to detect parallel cracks, and longitudinal heat conduction, which is analyzed to detect depth defect, or that which is beyond skin depth. In addition, the book explores methods, such as time domain, frequency domain and logarithm domain, also comparing A-scan , B-scan and C-scan. Sections on defect identification, classification and quantification are covered, as are advanced algorithms, principal components analysis (PCA), independent components analysis (ICA) and support vector machine (SVM). The book uses a lot of experimental studies on multi-layer aluminum structures, honeycomb structure, CFRP in the aerospace field, and steel and coating in the marine rail and transportation fields. - Presents two kinds of transient NDT testing, from theory and methodology, to applications - Includes time domain frequency domain and logarithm domain, which are all analyzed - Introduces A-scan , B-scan and C-scan, which are compared - Provides experimental studies for real damages, including corrosion and blister in steel, stress in aluminum, impact and delamination in CFRP laminates and RCF cracks are abundant

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Page Count

376

Publisher

Butterworth-Heinemann

Published Date

ISBN 10

0128128364

ISBN 13

9780128128367

Transient Electromagnetic-Thermal Nondestructive Testing

Pulsed Eddy Current and Transient Eddy Current Thermography

By: Yunze He,Bin Gao,Ali Sophian,Ruizhen Yang

Write a review Read reviews Take a Quiz Solve Book Puzzle

Transient Electromagnetic-Thermal Nondestructive Testing

Pulsed Eddy Current and Transient Eddy Current Thermography

By: Yunze He,Bin Gao,Ali Sophian,Ruizhen Yang

Transient Electromagnetic-Thermal Nondestructive Testing: Pulsed Eddy Current and Transient Eddy Current Thermography covers three key areas of theories, methods and applications, primarily the multi-physics field, including eddy current, heat conduction and Infrared radiation for defect evaluation, lateral heat conduction, which is analyzed to detect parallel cracks, and longitudinal heat conduction, which is analyzed to detect depth defect, or that which is beyond skin depth. In addition, the book explores methods, such as time domain, frequency domain and logarithm domain, also comparing A-scan , B-scan and C-scan. Sections on defect identification, classification and quantification are covered, as are advanced algorithms, principal components analysis (PCA), independent components analysis (ICA) and support vector machine (SVM). The book uses a lot of experimental studies on multi-layer aluminum structures, honeycomb structure, CFRP in the aerospace field, and steel and coating in the marine rail and transportation fields. - Presents two kinds of transient NDT testing, from theory and methodology, to applications - Includes time domain frequency domain and logarithm domain, which are all analyzed - Introduces A-scan , B-scan and C-scan, which are compared - Provides experimental studies for real damages, including corrosion and blister in steel, stress in aluminum, impact and delamination in CFRP laminates and RCF cracks are abundant

Average ratings

N/A

5

0%

4

0%

3

0%

2

0%

1

0%

Solve jigsaw puzzle

Age

Page Count

376

Publisher

Butterworth-Heinemann

Published Date

ISBN 10

0128128364

ISBN 13

9780128128367