Roland Wiesendanger's Books

Noncontact Atomic Force Microscopy

By: S. Morita,Roland Wiesendanger,E. Meyer

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Noncontact Atomic Force Microscopy

By: S. Morita,Roland Wiesendanger,E. Meyer

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

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468

Publisher

Springer Science & Business Media

Published Date

ISBN 10

3540431179

ISBN 13

9783540431176

Scanning Probe Microscopy and Spectroscopy

Methods and Applications

By: Roland Wiesendanger

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Scanning Probe Microscopy and Spectroscopy

Methods and Applications

By: Roland Wiesendanger

The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.

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664

Publisher

Cambridge University Press

Published Date

ISBN 10

0521428475

ISBN 13

9780521428477

Scanning Probe Microscopy

The Lab on a Tip

By: Ernst Meyer,Hans Josef Hug,Roland Bennewitz

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Scanning Probe Microscopy

The Lab on a Tip

By: Ernst Meyer,Hans Josef Hug,Roland Bennewitz

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

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Page Count

215

Publisher

Springer Science & Business Media

Published Date

ISBN 10

3662098016

ISBN 13

9783662098011

Scanning Probe Microscopy and Spectroscopy

Methods and Applications

By: Roland Wiesendanger

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Scanning Probe Microscopy and Spectroscopy

Methods and Applications

By: Roland Wiesendanger

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664

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Cambridge University Press

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ISBN 10

0521428475

ISBN 13

9780521428477

Scanning Tunneling Microscopy I

General Principles and Applications to Clean and Absorbate-Covered Surfaces

By: Hans-Joachim Güntherodt,Roland Wiesendanger

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Scanning Tunneling Microscopy I

General Principles and Applications to Clean and Absorbate-Covered Surfaces

By: Hans-Joachim Güntherodt,Roland Wiesendanger

Since the first edition of "Scanning 'funneling Microscopy I" has been pub lished, considerable progress has been made in the application of STM to the various classes of materials treated in this volume, most notably in the field of adsorbates and molecular systems. An update of the most recent develop ments will be given in an additional Chapter 9. The editors would like to thank all the contributors who have supplied up dating material, and those who have provided us with suggestions for further improvements. We also thank Springer-Verlag for the decision to publish this second edition in paperback, thereby making this book affordable for an even wider circle of readers. Hamburg, July 1994 R. Wiesendanger Preface to the First Edition Since its invention in 1981 by G. Binnig, H. Rohrer and coworkers at the IBM Zurich Research Laboratory, scanning tunneling microscopy (STM) has devel oped into an invaluable surface analytical technique allowing the investigation of real-space surface structures at the atomic level. The conceptual simplicity of the STM technique is startling: bringing a sharp needle to within a few Angstroms of the surface of a conducting sample and using the tunneling cur rent, which flows on application of a bias voltage, to sense the atomic and elec tronic surface structure with atomic resolution! Prior to 1981 considerable scepticism existed as to the practicability of this approach.

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Page Count

280

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Springer

Published Date

ISBN 10

3540584153

ISBN 13

9783540584155

Noncontact Atomic Force Microscopy

By: S. Morita,Roland Wiesendanger,E. Meyer

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Noncontact Atomic Force Microscopy

By: S. Morita,Roland Wiesendanger,E. Meyer

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Solve jigsaw puzzle

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Page Count

468

Publisher

Springer Science & Business Media

Published Date

ISBN 10

3540431179

ISBN 13

9783540431176

Book's by Roland Wiesendanger

Noncontact Atomic Force Microscopy

Noncontact Atomic Force Microscopy

Scanning Probe Microscopy and Spectroscopy

Scanning Probe Microscopy and Spectroscopy

Scanning Probe Microscopy

Scanning Probe Microscopy

Scanning Probe Microscopy and Spectroscopy

Scanning Probe Microscopy and Spectroscopy

Scanning Tunneling Microscopy I

Scanning Tunneling Microscopy I

Noncontact Atomic Force Microscopy

Noncontact Atomic Force Microscopy

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