This book constitutes the refereed proceedings of the Second International Conference on Pattern Recognition and Machine Intelligence, PReMI 2007, held in Kolkata, India in December 2007. The 82 revised papers presented were carefully reviewed and selected from 241 submissions. The papers are organized in topical sections on pattern recognition, image analysis, soft computing and applications, data mining and knowledge discovery, bioinformatics, signal and speech processing, document analysis and text mining, biometrics, and video analysis.
This review volume provides from both theoretical and application points of views, recent developments and state-of-the-art reviews in various areas of pattern recognition, image processing, machine learning, soft computing, data mining and web intelligence. Machine Interpretation of Patterns: Image Analysis and Data Mining is an essential and invaluable resource for professionals and advanced graduates in computer science, mathematics and life sciences. It can also be considered as an integrated volume to researchers interested in doing interdisciplinary research where computer science is a component.
Research into Tunneling Field Effect Transistors (TFETs) has developed significantly in recent times, indicating their significance in low power integrated circuits. This book describes the qualitative and quantitative fundamental concepts of TFET functioning, the essential components of the problem of modelling the TFET, and outlines the most commonly used mathematical approaches for the same in a lucid language. Divided into eight chapters, the topics covered include: Quantum Mechanics, Basics of Tunneling, The Tunnel FET, Drain current modelling of Tunnel FET: The task and its challenges, Modeling the Surface Potential in TFETs, Modelling the Drain Current, and Device simulation using Technology Computer Aided Design (TCAD). The information is well organized, describing different phenomena in the TFETs using simple and logical explanations. Key features: * Enables readers to understand the basic concepts of TFET functioning and modelling in order to read, understand, and critically analyse current research on the topic with ease. * Includes state-of-the-art work on TFETs, attempting to cover all the recent research articles published on the subject. * Discusses the basic physics behind tunneling, as well as the device physics of the TFETs. * Provides detailed discussion on device simulations along with device physics so as to enable researchers to carry forward their study on TFETs. Primarily targeted at new and practicing researchers and post graduate students, the book would particularly be useful for researchers who are working in the area of compact and analytical modelling of semiconductor devices.
A generic DC grid model that is compatible with the standard AC system stability model is presented and used to analyse the interaction between the DC grid and the host AC systems. A multi-terminal DC (MTDC) grid interconnecting multiple AC systems and offshore energy sources (e.g. wind farms) across the nations and continents would allow effective sharing of intermittent renewable resources and open market operation for secure and cost-effective supply of electricity. However, such DC grids are unprecedented with no operational experience. Despite lots of discussions and specific visions for setting up such MTDC grids particularly in Europe, none has yet been realized in practice due to two major technical barriers: Lack of proper understanding about the interaction between a MTDC grid and the surrounding AC systems. Commercial unavailability of efficient DC side fault current interruption technology for conventional voltage sourced converter systems This book addresses the first issue in details by presenting a comprehensive modeling, analysis and control design framework. Possible methodologies for autonomous power sharing and exchange of frequency support across a MTDC grid and their impact on overall stability is covered. An overview of the state-of-the-art, challenges and on-going research and development initiatives for DC side fault current interruption is also presented.
This will help us customize your experience to showcase the most relevant content to your age group
Please select from below
Login
Not registered?
Sign up
Already registered?
Success – Your message will goes here
We'd love to hear from you!
Thank you for visiting our website. Would you like to provide feedback on how we could improve your experience?
This site does not use any third party cookies with one exception — it uses cookies from Google to deliver its services and to analyze traffic.Learn More.