A better understanding of the microstructure of metals and alloys has led to great advances in the performance and useful applications of these, the oldest of mankind's engineered materials. This book in the Materials Characterizations series focuses on the particular molecular and atomistic properties of metals insofar as how they affect the different techniques for measuring and analyzing internal structure, surface structure, and chemical/physical properties. It provides a vital connection between commonly used characterization techniques like Scanning Electron Microscopy and how such can be used in the various ways that metals are processed, machined, and used. Review of relevant mechanical and chemical properties of metals and how they affect characterization techniques Characterization techniques used for melting and casting, machining, and metallic thin films processes Concise summaries of major characterization technologies for metals and alloys, including Auger Electron Spectroscopy, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis, Scanning Electron Microscopy, and Transmission Electron Spectroscopy
This book reviews the recent advances and current technologies used to produce microelectronic and optoelectronic devices from compound semiconductors. It provides a complete overview of the technologies necessary to grow bulk single-crystal substrates, grow hetero-or homoepitaxial films, and process advanced devices such as HBT's, QW diode lasers, etc.
This book provides a review of the state-of-the-advancing-art in growth, processing and devices from compound semiconductors. Consisting of the proceedings of an important topical conference held at the University of Florida, speakers from both the U.S. and Japan were present. This fascinating work discusses critical issues in growth and characterization by semi-insulating bulk crystals, with particular emphasis placed on the latest modification of gas sources. It includes the advantages, limitations, and techniques pertaining to chemical vapor deposition. This compilation presents the most recent advances in the new technologies involving compound semiconductors, thus it fills an important need in the fast-moving field of microelectronics. This one-of-a-kind resource provides contrasts and insight into U.S. and Japanese technologies and devices as well as indications of future directions. It provides a very up-to-date and comprehensive treatment of world-class scientific and technological developments in this astounding area of major commercial importance. These proceedings will be a useful, indispensable resource for scientific researchers, process engineers, and technology strategists.
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