The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading. Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics Presents theory and it's application in a practical sense, providing long awaited solutions and new findings Provides a comprehensive overview of international congress proceedings and associated publications, as source material
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Electron Optics, Second English Edition, Part I: Optics is a 10-chapter book that begins by elucidating the fundamental features and basic techniques of electron optics, as well as the distribution of potential and field in electrostatic lenses. This book then explains the field distribution in magnetic lenses; the optical properties of electrostatic and magnetic lenses; and the similarities and differences between glass optics and electron optics. Subsequent chapters focus on lens defects; some electrostatic lenses and triode guns; and magnetic lens models. The strong focusing lenses and prism optics are also described. This book will be useful to graduating students, as well as to beginners who sometimes feel lost in the abundant specialized literature.
This is a complete handbook and reference volume which covers everything that one needs to know about electron optics. It is a comprehensive coverage of theoretical background and modern computing methods. It contains a detailed and unique account of numerical methods and an extensive bibliography.
Electron Optics, Second English Edition, Part I: Optics is a 10-chapter book that begins by elucidating the fundamental features and basic techniques of electron optics, as well as the distribution of potential and field in electrostatic lenses. This book then explains the field distribution in magnetic lenses; the optical properties of electrostatic and magnetic lenses; and the similarities and differences between glass optics and electron optics. Subsequent chapters focus on lens defects; some electrostatic lenses and triode guns; and magnetic lens models. The strong focusing lenses and prism optics are also described. This book will be useful to graduating students, as well as to beginners who sometimes feel lost in the abundant specialized literature.
This book provides a fundamentally new approach to pattern recognition in which objects are characterized by relations to other objects instead of by using features or models. This 'dissimilarity representation' bridges the gap between the traditionally opposing approaches of statistical and structural pattern recognition.Physical phenomena, objects and events in the world are related in various and often complex ways. Such relations are usually modeled in the form of graphs or diagrams. While this is useful for communication between experts, such representation is difficult to combine and integrate by machine learning procedures. However, if the relations are captured by sets of dissimilarities, general data analysis procedures may be applied for analysis.With their detailed description of an unprecedented approach absent from traditional textbooks, the authors have crafted an essential book for every researcher and systems designer studying or developing pattern recognition systems.
“[Singer's] enthusiasm becomes infectious . . . Wired for War is a book of its time: this is strategy for the Facebook generation.” —Foreign Affairs “An engrossing picture of a new class of weapon that may revolutionize future wars. . .” —Kirkus Reviews P. W. Singer explores the greatest revolution in military affairs since the atom bomb: the dawn of robotic warfare We are on the cusp of a massive shift in military technology that threatens to make real the stuff of I, Robot and The Terminator. Blending historical evidence with interviews of an amazing cast of characters, Singer shows how technology is changing not just how wars are fought, but also the politics, economics, laws, and the ethics that surround war itself. Travelling from the battlefields of Iraq and Afghanistan to modern-day "skunk works" in the midst of suburbia, Wired for War will tantalise a wide readership, from military buffs to policy wonks to gearheads.
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