The main purpose of this book is to provide an overview of all phenomena which can be categorized under the general label of “electron scattering”, and to give a comprehensive description of all spectroscopical techniques related to electron scattering phenomena. Various classes of events are examined (electron in-electron out, photon in-electron out, electron in-two electron out, electron diffraction), together with the corresponding experimental techniques. A description of the underlying physics of various electron scattering phenomena is provided. For each spectroscopy, the general principles, the main fields of application, and some selected representative cases are discussed. The use of relatively low-cost electron sources is emphasized with respect to photon sources. The book is directed to PhD students and researchers not necessarily yet expert in the field.
This book describes the computational methods most frequently used to deal with the interaction of charged particles, notably electrons, with condensed matter. Both elastic and inelastic scattering phenomena are discussed, and methods for calculating the relevant cross sections are explained in a rigorous but simple way. It provides readers with all the information they need in order to write their own Monte Carlo code and to simulate the transport of fast particles in condensed matter. Many numerical and experimental examples are presented throughout the book. The updated and extended fourth edition features ab initio methods for calculating dielectric function and energy loss function. Non-relativistic partial wave expansion method for calculating the differential elastic scattering cross section is also included in this new edition. It represents a very useful introduction to the relativistic partial wave expansion method, i.e., to the Mott theory, already discussed in the previous editions of this book. Further details about the effects of spin-polarization on the differential elastic scattering cross section are included in this new edition. The multiple reflection method is extended to the general case of a system composed of a set of layers of different materials and thicknesses. Analytical expressions are provided for calculating the backscattering coefficient of multilayers. New results are presented, notably about Monte Carlo simulations of reflection electron energy loss spectra and of the radial dose deposited along the track of ions impinging on materials.
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