This book presents a new approach to on-line observation and concurrent checking of processors by refining and improving known techniques and introducing new ideas.The proposed on-line error detection and fast recover techniques support and complement other established methods. In combination with other on-line observation priniciples and with a combined hardware-software test, these techniques are used to fulfill a complete self-check scheme for an embedded processor.
The leading reference on this topic has just gotten better. Building on the success of the previous two editions, all the chapters have been updated to reflect the latest developments in the field, and new chapters have been added on picolinic acids, oxathiapiprolin, flupyradifurone, and other topics. This third edition presents the most important active ingredients of modern agrochemicals, with one volume each for herbicides, fungicides, and insecticides. The international team of first-class authors from such renowned crop science companies as Bayer, Syngenta, Dow AgroSciences, DuPont (now Corteva Agriscience), and BASF, address all crucial aspects from the general chemistry and the mode of action to industrial-scale synthesis, as well as from the development of products and formulations to their application in the field. A comprehensive and invaluable source of timely information for all of those working in modern biology, including genetics, biochemistry and chemistry, and for those in modern crop protection science, whether governmental authorities, researchers in agrochemical companies, scientists at universities, conservationists, or managers in organizations and companies involved in improvements to agricultural production.
This research monograph discusses the close correlation between the magnetic and structural properties of thin films in the context of numerous examples of epitaxial metal films, while emphasis is laid on the stabilization of novel structures compared to the bulk material. Further options, possibilities, and limits for applications are given. Techniques for the characterization of thin films are addressed as well.
This book presents a new approach to on-line observation and concurrent checking of processors by refining and improving known techniques and introducing new ideas.The proposed on-line error detection and fast recover techniques support and complement other established methods. In combination with other on-line observation priniciples and with a combined hardware-software test, these techniques are used to fulfill a complete self-check scheme for an embedded processor.
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