Manoj Sachdev's Books

Thermal and Power Management of Integrated Circuits

By: Arman Vassighi,Manoj Sachdev

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Thermal and Power Management of Integrated Circuits

By: Arman Vassighi,Manoj Sachdev

In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime. This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book.

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Page Count

188

Publisher

Springer Science & Business Media

Published Date

ISBN 10

0387297499

ISBN 13

9780387297491

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

By: Manoj Sachdev,José Pineda de Gyvez

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

By: Manoj Sachdev,José Pineda de Gyvez

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

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Page Count

343

Publisher

Springer Science & Business Media

Published Date

ISBN 10

0387465472

ISBN 13

9780387465470

Defect Oriented Testing for CMOS Analog and Digital Circuits

By: Manoj Sachdev

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Defect Oriented Testing for CMOS Analog and Digital Circuits

By: Manoj Sachdev

Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal

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Page Count

317

Publisher

Springer Science & Business Media

Published Date

ISBN 10

1475749260

ISBN 13

9781475749267

ESD Protection Device and Circuit Design for Advanced CMOS Technologies

By: Oleg Semenov,Hossein Sarbishaei,Manoj Sachdev

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ESD Protection Device and Circuit Design for Advanced CMOS Technologies

By: Oleg Semenov,Hossein Sarbishaei,Manoj Sachdev

ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the problems associated with ESD failures and yield losses become significant in the modern semiconductor industry, the demand for graduates with a basic knowledge of ESD is also increasing. Today, there is a significant demand to educate the circuits design and reliability teams on ESD issues. This book makes an attempt to address the ESD design and implementation in a systematic manner. A design procedure involving device simulators as well as circuit simulator is employed to optimize device and circuit parameters for optimal ESD as well as circuit performance. This methodology, described in ESD Protection Device and Circuit Design for Advanced CMOS Technologies has resulted in several successful ESD circuit design with excellent silicon results and demonstrates its strengths.

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Page Count

237

Publisher

Springer Science & Business Media

Published Date

ISBN 10

1402083017

ISBN 13

9781402083013

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Process-Aware SRAM Design and Test

By: Andrei Pavlov,Manoj Sachdev

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Process-Aware SRAM Design and Test

By: Andrei Pavlov,Manoj Sachdev

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

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Page Count

203

Publisher

Springer Science & Business Media

Published Date

ISBN 10

1402083637

ISBN 13

9781402083631

Protection Challenges in Meeting Increasing Electric Power Demand

By: Om Hari Gupta,Manoj Tripathy,Vijay K. Sood

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Protection Challenges in Meeting Increasing Electric Power Demand

By: Om Hari Gupta,Manoj Tripathy,Vijay K. Sood

This reference book provides a detailed discussion on the protection challenges that arise due to technological improvements in transmission and distribution systems to supply increasing power demand. The primary focus of this book is transmission line protection with FACTS devices connected to the line and islanding detection in an active distribution system i.e., microgrids. First, a literature review on the protection of transmission lines in the presence of switching devices is presented. The following chapters then present commonly proposed modifications required in the power system to meet increasing power demands, commonly used existing protection schemes and their limitations in the presence of switching devices, and solutions to these limitations in protection schemes. Results from fault simulations using PSCAD/EMTDC and MATLAB are also included. This book will be valuable to graduate students and practicing engineers alike for dealing with protection issues in transmission and distribution systems incorporating FACTS devices. Provides thorough knowledge of trends in transmission networks for the enhancement of power flow, control and protection Presents an analysis of requirements of microgrids in the future Highlights challenges in the protection of active distribution systems or microgrids against islanding in the presence of distributed generation

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Page Count

151

Publisher

Springer Nature

Published Date

ISBN 10

3030605000

ISBN 13

9783030605001

Magnesium, Magnesium Alloys, and Magnesium Composites

By: Manoj Gupta,Sharon Nai Mui Ling

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Magnesium, Magnesium Alloys, and Magnesium Composites

By: Manoj Gupta,Sharon Nai Mui Ling

A look at the current and future uses of magnesium-based products and their role in the world's environmental and technological revolution The lightest of all structural metals, having one-fourth the density of steel and two-thirds that of aluminum, magnesium has already been adopted as an alternative construction material in applications as far ranging as automotive and sports equipment, electronics, and space technology. In a world concerned with minimizing the environmental impact of products, the choice of light-weight, energy-saving, and high-performance materials, like magnesium, would seem a small, significant step towards improving life on this planet. Magnesium, Magnesium Alloys, and Magnesium Composites introduces the science and current applications of this important metal, shedding light on the magnesium-based composites developed over the last fifteen years. Chapters include in-depth discussion of: The characteristics of pure magnesium—including atomic properties and crystal structure as well as physical, electrical, and mechanical properties Magnesium alloys—and the effects of the alloying elements, such as aluminum, lithium, copper, nickel, and silicon The properties of magnesium-based composites—and the effects of different types (metallic, ceramic, interconnected, and intermetallic) of reinforcements of varying length (from micron scale to nanometric length) Corrosion aspects of magnesium-based materials Magnesium-based products in medicine, sports equipment, and the automotive, aerospace, and electronics industries Bringing together, for the first time, the science, properties, and technologies relating to the current and future uses of magnesium, this important reference also offers readers a glimpse of a not-too-distant world in which environmental safety and sound engineering are a reality.

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