Manjul Bhushan's Books

CMOS Test and Evaluation

A Physical Perspective

By: Manjul Bhushan,Mark B. Ketchen

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CMOS Test and Evaluation

A Physical Perspective

By: Manjul Bhushan,Mark B. Ketchen

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

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Page Count

431

Publisher

Springer

Published Date

ISBN 10

1493913492

ISBN 13

9781493913497

Microelectronic Test Structures for CMOS Technology

By: Manjul Bhushan,Mark B. Ketchen

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Microelectronic Test Structures for CMOS Technology

By: Manjul Bhushan,Mark B. Ketchen

Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors’ overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.

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Page Count

401

Publisher

Springer Science & Business Media

Published Date

ISBN 10

1441993770

ISBN 13

9781441993779

Microelectronic Test Structures for CMOS Technology

By: Manjul Bhushan,Mark B. Ketchen

Write a review Read reviews Take a Quiz Solve Book Puzzle

Microelectronic Test Structures for CMOS Technology

By: Manjul Bhushan,Mark B. Ketchen

Average ratings

N/A

Write a review

Solve jigsaw puzzle

Age

Page Count

401

Publisher

Springer Science & Business Media

Published Date

ISBN 10

1441993770

ISBN 13

9781441993779

Book's by Manjul Bhushan

CMOS Test and Evaluation

CMOS Test and Evaluation

Microelectronic Test Structures for CMOS Technology

Microelectronic Test Structures for CMOS Technology

Microelectronic Test Structures for CMOS Technology

Microelectronic Test Structures for CMOS Technology

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