A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale • Highlights the advanced research work from industry and academia in micro-nano devices test technology • Written at both introductory and advanced levels, provides the fundamentals and theories • Focuses on the measurement techniques for characterizing MEMS/NEMS devices
The present study deals with heat transport phenomena through thermal barrier coatings and consists of two parts. The first part focuses on the radiation properties of semitransparent materials and the effect of radiation on the temperature distributions within a TBC. The second part focuses on measuring thermal diffusivity of materials. A new data reduction, numerical method is introduced and several important aspects related to the accuracy of the thermal diffusivity measurement of monolithic and coated materials by thermal flash technique are highlighted."--Page vi
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale • Highlights the advanced research work from industry and academia in micro-nano devices test technology • Written at both introductory and advanced levels, provides the fundamentals and theories • Focuses on the measurement techniques for characterizing MEMS/NEMS devices
Based on the authors’ research, this book introduces the main processing techniques in hyperspectral imaging. In this context, SVM-based classification, distance comparison-based endmember extraction, SVM-based spectral unmixing, spatial attraction model-based sub-pixel mapping and MAP/POCS-based super-resolution reconstruction are discussed in depth. Readers will gain a comprehensive understanding of these cutting-edge hyperspectral imaging techniques. Researchers and graduate students in fields such as remote sensing, surveying and mapping, geosciences and information systems will benefit from this valuable resource.
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