An Advanced Study Institute on Radiative Processes in Discharge Plasmas was held at the Atholl Palace Hotel, Pitlochry, Perthshire, Scotland, June 23 through July 5, 1985. This publication is the Pro ceedings from that Institute. The Institute was attended by eighty-five Participants and Lecturers representing the United States, Canada, France, West Germany, Greece, The Netherlands, Portugal, Turkey, the United Kingdom, and Switzerland. A distinguished faculty of eighteen Lecturers was assembled and the topical program organized with the assistance of an Advisory Committee composed of: Dr. John Waymouth, USA; Dr. Timm Teich, Switzerland; Dr. Arthur Phelps, USA; Dr. Nicol Peacock, England; Professor Erich Kunhardt, USA; Dr. Anthony Hyder, USA; and Dr. Arthur Guenther, USA. The underlying theme and objective of the Institute was the enhance ment of scientific communication and exchange among academic, industrial, and national laboratory groups having a common concern for radiative processes in discharge plasmas. The program was organized into four major sessions sequentially treating: the fundamental science of visible and near-visible radiation in plasmas; the technology of discharge light sources; recent and novel methods for the generation of plasmas; and an update on advances in laser-based diagnostics. Each major session culmi nated in a panel discussion comprised of the Lecturers for that session.
The Advanced Study Institute on Breakdown and Discharges in Gases was held in Les Arcs, France, June 28 to July 10, 1981. The object of the Institute was to provide a broad but compre hensive presentation of the various topics in the field of Gaseous electronics. To achieve this goal, a number of lectures, seminars, and panel discussions were scheduled. Each topic was developed by two tutorial and/or review lectures, and brought to the present state of the topic by seminars and panel discussions. The program of topics and speakers was selected with the assistance of the advisory committee composed of: J. A. Rees, European Coordinator, England; M. Goldman, French Coordinator, France; A. H. Guenther, USA; M. Kristiansen, USA; and A. V. Phelps, USA. The most memorable aspect of the Institute was the sustained high interest of the faculty and participants for the two week period. The daily schedule was demanding: five hours of lectures, two hours of seminars and one of discussion. These sessions were often extended because of presentation by the participants of im proptu seminars. The discussions were intense. Majestic }10nt Blanc provided the backdrop for the lecture hall, and these surroundings and the weather contributed to the overall positive mood. It was a wonderful occasion. The lectures and seminars have been collected into two volumes.
An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy sis techniques that can be employed to investigate fast physical events, nominally in the sub-microsecond regime. This requires both an understanding of the basic principles underlying the diagnostic employed and its limitations, and a knowledge of the practical techniques available to obtain reliable and repeatable data. This Institute was thus structured to begin tutorially, followed by more practical techniques, demonstrations, and discussions. The Institute was divided into the following major sections: (1) Overview of Applications and Needs; (2) Voltage and Current Measurements; (3) Data Acquisition; (4) Grounding and Shield ing; (5) Fast Photography; (6) Refractive Index Measurements; (7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti cal Techniques. This Proceeding has been divided into two separate volumes. Volume 1, Current and Voltage Measurements, includes Sections (1) through (4) above; Volume 2, Optical Meas urements, includes Sections (5) through (9).
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