Eishi Ibe's Books

Terrestrial Neutron-induced Soft Error In Advanced Memory Devices

By: Takashi Nakamura,Eishi Ibe,Mamoru Baba,Yasuo Yahagi,Hideaki Kameyama

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Terrestrial Neutron-induced Soft Error In Advanced Memory Devices

By: Takashi Nakamura,Eishi Ibe,Mamoru Baba,Yasuo Yahagi,Hideaki Kameyama

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

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Page Count

364

Publisher

World Scientific

Published Date

ISBN 10

9814472395

ISBN 13

9789814472395

Dependability in Electronic Systems

Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances

By: Nobuyasu Kanekawa,Eishi H. Ibe,Takashi Suga,Yutaka Uematsu

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Dependability in Electronic Systems

Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances

By: Nobuyasu Kanekawa,Eishi H. Ibe,Takashi Suga,Yutaka Uematsu

This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.

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Page Count

226

Publisher

Springer Science & Business Media

Published Date

ISBN 10

144196715X

ISBN 13

9781441967152

Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

By: Eishi H. Ibe

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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

By: Eishi H. Ibe

This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.

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