Eddy Simoen's Books

CMOS Past, Present and Future

By: Henry Radamson,Eddy Simoen,Jun Luo,Chao Zhao

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CMOS Past, Present and Future

By: Henry Radamson,Eddy Simoen,Jun Luo,Chao Zhao

CMOS Past, Present and Future provides insight from the basics, to the state-of-the-art of CMOS processing and electrical characterization, including the integration of Group IV semiconductors-based photonics. The book goes into the pitfalls and opportunities associated with the use of hetero-epitaxy on silicon with strain engineering and the integration of photonics and high-mobility channels on a silicon platform. It begins with the basic definitions and equations, but extends to present technologies and challenges, creating a roadmap on the origins of the technology and its evolution to the present, along with a vision for future trends. The book examines the challenges and opportunities that materials beyond silicon provide, including a close look at high-k materials and metal gate, strain engineering, channel material and mobility, and contacts. The book's key approach is on characterizations, device processing and electrical measurements. - Addresses challenges and opportunities for the use of CMOS - Covers the latest methods of strain engineering, materials integration to increase mobility, nano-scaled transistor processing, and integration of CMOS with photonic components - Provides a look at the evolution of CMOS technology, including the origins of the technology, current status and future possibilities

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Page Count

280

Publisher

Woodhead Publishing

Published Date

ISBN 10

0081021402

ISBN 13

9780081021408

Extended Defects in Germanium

Fundamental and Technological Aspects

By: Cor Claeys,Eddy Simoen

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Extended Defects in Germanium

Fundamental and Technological Aspects

By: Cor Claeys,Eddy Simoen

The aim is to give an overview of the physics of extended defects in Germanium, i.e. dislocations (line defects), grain boundaries, stacking faults, twins and {311} defects (two-dimensional defects) and precipitates, bubbles, etc. The first part covers fundamentals, describing the crystallographic structure and other physical and electrical properties, mainly of dislocations. Since dislocations are essential for the plastic deformation of Germanium, methods for analysis and imaging of dislocations and to evaluate their structure are described. Attention is given to the electrical and optical properties, which are important for devices made in dislocated Ge. The second part treats the creation of extended defects during wafer and device processing. Issues are addressed such as defect formation during ion implantation, necessary to create junctions, which are an essential part in every device type. Extended defects are also created during the deposition of thin or thick epitaxial layers on other substrates, which are important for optoelectronic and photovoltaic applications. In brief, the book is intended to provide a fundamental understanding of the extended-defect formation during Ge materials and device processing, providing ways to distinguish harmful from less detrimental defects and should point out ways for defect engineering and control.

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Page Count

317

Publisher

Springer Science & Business Media

Published Date

ISBN 10

3540856145

ISBN 13

9783540856146

Radiation Effects in Advanced Semiconductor Materials and Devices

By: C. Claeys,Eddy Simoen

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Radiation Effects in Advanced Semiconductor Materials and Devices

By: C. Claeys,Eddy Simoen

This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.

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Page Count

440

Publisher

Springer Science & Business Media

Published Date

ISBN 10

3540433937

ISBN 13

9783540433934

Metal Impurities in Silicon- and Germanium-Based Technologies

Origin, Characterization, Control, and Device Impact

By: Cor Claeys,Eddy Simoen

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Metal Impurities in Silicon- and Germanium-Based Technologies

Origin, Characterization, Control, and Device Impact

By: Cor Claeys,Eddy Simoen

This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices’ performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

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Page Count

464

Publisher

Springer

Published Date

ISBN 10

3319939254

ISBN 13

9783319939254

CMOS Past, Present and Future

By: Henry Radamson,Eddy Simoen,Jun Luo,Chao Zhao

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CMOS Past, Present and Future

By: Henry Radamson,Eddy Simoen,Jun Luo,Chao Zhao

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Page Count

280

Publisher

Woodhead Publishing

Published Date

ISBN 10

0081021402

ISBN 13

9780081021408

Metal Impurities in Silicon- and Germanium-Based Technologies

Origin, Characterization, Control, and Device Impact

By: Cor Claeys,Eddy Simoen

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Metal Impurities in Silicon- and Germanium-Based Technologies

Origin, Characterization, Control, and Device Impact

By: Cor Claeys,Eddy Simoen

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Page Count

464

Publisher

Springer

Published Date

ISBN 10

3319939254

ISBN 13

9783319939254

Germanium-Based Technologies

From Materials to Devices

By: Cor Claeys,Eddy Simoen

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Germanium-Based Technologies

From Materials to Devices

By: Cor Claeys,Eddy Simoen

Germanium is a semiconductor material that formed the basis for the development of transistor technology. Although the breakthrough of planar technology and integrated circuits put silicon in the foreground, in recent years there has been a renewed interest in germanium, which has been triggered by its strong potential for deep submicron (sub 45 nm) technologies. Germanium-Based technologies: From Materials to Devices is the first book to provide a broad, in-depth coverage of the field, including recent advances in Ge-technology and the fundamentals in material science, device physics and semiconductor processing. The contributing authors are international experts with a world-wide recognition and involved in the leading research in the field. The book also covers applications and the use of Ge for optoelectronics, detectors and solar cells. An ideal reference work for students and scientists working in the field of physics of semiconductor devices and materials, as well as for engineers in research centres and industry. Both the newcomer and the expert should benefit from this unique book. - State-of-the-art information available for the first time as an all-in-source - Extensive reference list making it an indispensable reference book - Broad coverage from fundamental aspects up to industrial applications

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Page Count

476

Publisher

Elsevier

Published Date

ISBN 10

008047490X

ISBN 13

9780080474908

Radiation Effects in Advanced Semiconductor Materials and Devices

By: C. Claeys,Eddy Simoen

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Radiation Effects in Advanced Semiconductor Materials and Devices

By: C. Claeys,Eddy Simoen

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Page Count

440

Publisher

Springer Science & Business Media

Published Date

ISBN 10

3540433937

ISBN 13

9783540433934

Extended Defects in Germanium

Fundamental and Technological Aspects

By: Cor Claeys,Eddy Simoen

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Extended Defects in Germanium

Fundamental and Technological Aspects

By: Cor Claeys,Eddy Simoen

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Solve jigsaw puzzle

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Page Count

317

Publisher

Springer Science & Business Media

Published Date

ISBN 10

3540856145

ISBN 13

9783540856146

Book's by Eddy Simoen

CMOS Past, Present and Future

CMOS Past, Present and Future

Extended Defects in Germanium

Extended Defects in Germanium

Radiation Effects in Advanced Semiconductor Materials and Devices

Radiation Effects in Advanced Semiconductor Materials and Devices

Metal Impurities in Silicon- and Germanium-Based Technologies

Metal Impurities in Silicon- and Germanium-Based Technologies

CMOS Past, Present and Future

CMOS Past, Present and Future

Metal Impurities in Silicon- and Germanium-Based Technologies

Metal Impurities in Silicon- and Germanium-Based Technologies

Germanium-Based Technologies

Germanium-Based Technologies

Radiation Effects in Advanced Semiconductor Materials and Devices

Radiation Effects in Advanced Semiconductor Materials and Devices

Extended Defects in Germanium

Extended Defects in Germanium

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