Improve design efficiency and reduce costs with this practical guide to formal and simulation-based functional verification. Giving you a theoretical and practical understanding of the key issues involved, expert authors including Wayne Wolf and Dan Gajski explain both formal techniques (model checking, equivalence checking) and simulation-based techniques (coverage metrics, test generation). You get insights into practical issues including hardware verification languages (HVLs) and system-level debugging. The foundations of formal and simulation-based techniques are covered too, as are more recent research advances including transaction-level modeling and assertion-based verification, plus the theoretical underpinnings of verification, including the use of decision diagrams and Boolean satisfiability (SAT).
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design. Provides a complete and concise introduction to SRAM bitcell design and analysis; Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design.
Resource extraction and conflicts over natural resources are a global phenomenon, including in India. This book explores the process of state formation through developmental intervention in the resource-rich areas of Jharkhand in eastern India which are inhabited by the indigenous Ho community. The cultural practices and livelihoods of Indigenous tribes, like the Ho community in Jharkhand, are deeply linked with the local ecology. The conflict in Jharkhand is intertwined with state development projects and capitalist interventions. This book examines the history of these projects and the issues of territorialisation, dispossession, accumulation, and marginalization which communities have been fighting against for many decades. It examines the process of development policies and projects shaping and restructuring the resource-rich ecology in the region and addresses the interrelated issues of development-induced dispossession, resistance, ecological transformation, governance, illegalities, and state-building. It focuses on the questions: what do development projects bring to the Ho community; what induces them to resist and negotiate; and how state decentralization schemes and local governance in resource conflict areas strengthen State capacities? The book highlights the consequences on the livelihoods and cultural practices of the local people because of ecological transformation and everyday resistance. Comprehensive and important, this book will be of interest to students and researchers of anthropology, sociology, political ecology, social work, development studies, ecology, developmental sociology, indigenous studies, law, and economic anthropology.
Improve design efficiency and reduce costs with this practical guide to formal and simulation-based functional verification. Giving you a theoretical and practical understanding of the key issues involved, expert authors including Wayne Wolf and Dan Gajski explain both formal techniques (model checking, equivalence checking) and simulation-based techniques (coverage metrics, test generation). You get insights into practical issues including hardware verification languages (HVLs) and system-level debugging. The foundations of formal and simulation-based techniques are covered too, as are more recent research advances including transaction-level modeling and assertion-based verification, plus the theoretical underpinnings of verification, including the use of decision diagrams and Boolean satisfiability (SAT).
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design. Provides a complete and concise introduction to SRAM bitcell design and analysis; Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design.
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design. Provides a complete and concise introduction to SRAM bitcell design and analysis; Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design.
In the ten years since the publication of the first edition of this book, the field of fault-tolerant design has broadened in appeal, particularly with its emerging application in distributed computing. This new edition specifically deals with this dynamically changing computing environment, incorporating new topics such as fault-tolerance in multiprocessor and distributed systems.
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