Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.
Transylvania has some of the most valuable monuments of medieval architecture in Europe: the easternmost churches built in Romanesque style, Cistercian monasteries, Gothic buildings, and fortified churches. This book explores archaeological sources to bring to light the hidden past of these monuments.
This book investigates the permutation polynomial (PP) based interleavers for turbo codes, including all the main theoretical and practical findings related to topics such as full coefficient conditions for PPs up to fifth; the number of all true different PPs up to fifth degree; the number of true different PPs under Zhao and Fan sufficient conditions, for any degree (with direct formulas or with a simple algorithm); parallel decoding of turbo codes using PP interleavers by butterfly networks; upper bounds of the minimum distance for turbo codes with PP interleavers; specific methods to design and find PP interleavers with good bit/frame error rate (BER/FER) performance. The theoretical results are explained in great detail to enhance readers’ understanding. The book is intended for engineers in the telecommunications field, but the chapters dealing with the PP coefficient conditions and with the number of PP are of interest to mathematicians working in the field.
This book tells the remarkable story of the decline and revival of the Russian Orthodox Church in the first half of the twentieth century and the astonishing U-turn in the attitude of the Soviet Union’s leaders towards the church. In the years after 1917 the Bolsheviks’ anti-religious policies, the loss of the former western territories of the Russian Empire, and the Soviet Union’s isolation from the rest of the world and the consequent separation of Russian emigrés from the church were disastrous for the church, which declined very significantly in the 1920s and 1930s. However, when Poland was partitioned in 1939 between Nazi Germany and the Soviet Union, Stalin allowed the Patriarch of Moscow, Sergei, jurisdiction over orthodox congregations in the conquered territories and went on, later, to encourage the church to promote patriotic activities as part of the resistance to the Nazi invasion. He agreed a Concordat with the church in 1943, and continued to encourage the church, especially its claims to jurisdiction over émigré Russian orthodox churches, in the immediate postwar period. Based on extensive original research, the book puts forward a great deal of new information and overturns established thinking on many key points.
Living Well Together investigates the development of the Neolithic in southeast and central Europe from 6500-3500 cal BC with special reference to the manifestations of settling down. A collection of reports and comments on recent fieldwork in the region, Living Well Together? provides 14 tightly written and targeted papers presenting interpretive discussions from important excavations and reassessments of our understanding of the Neolithic. Each paper makes a significant contribution to existing knowledge about the period, and the book, like its companion (Un)settling the Neolithic (Oxbow 2005) will be a benchmark text for work in this region. The reports in Living Well Together? play out the critical questions posed in the earlier volume: how should one interpret settlement; what of the difference between tells and flat sites; what do we mean by permanent occupation; can we avoid the assumptions that underlie claims for year-round residence or seasonal occupation; why, in some regions and at some times, did people maintain residence for so many generations that monumental tell settlements grew to dominate the visual and social landscape; what would a viewshed analysis of tells reveal; what are the dynamics of households in Neolithic Greece; how should we see the emergence of pottery in terms of material culture; and what were the origins of the LBK, and how can we understand its development? The volume's authors have succeeded in attacking existing thought, in provoking new discussion and in creating new paths to understanding the nature of human existence in the Neolithic. Together they set a new agenda for studying the Neolithic across and beyond southeastern and central Europe.
Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.
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