High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.
Material Characterization using Electron Holography Exploration of a unique technique that offers exciting possibilities to analyze electromagnetic behavior of materials Material Characterization using Electron Holography addresses how the electromagnetic field can be directly visualized and precisely interpreted based on Maxwell’s equations formulated by special relativity, leading to the understanding of electromagnetic properties of advanced materials and devices. In doing so, it delivers a unique route to imaging materials in higher resolution. The focus of the book is on in situ observation of electromagnetic fields of diverse functional materials. Furthermore, an extension of electron holographic techniques, such as direct observation of accumulation and collective motions of electrons around the charged insulators, is also explained. This approach enables the reader to develop a deeper understanding of functionalities of advanced materials. Written by two highly qualified authors with extensive first-hand experience in the field, Material Characterization using Electron Holography covers topics such as: Importance of electromagnetic fields and their visualization, Maxwell’s equations formulated by special relativity, and de Broglie waves and wave functions Outlines of general relativity and Einstein’s equations, principles of electron holography, and related techniques Simulation of holograms and visualized electromagnetic fields, electric field analysis, and in situ observation of electric fields Interaction between electrons and charged specimen surfaces and interpretation of visualization of collective motions of electrons For materials scientists, analytical chemists, structural chemists, analytical research institutes, applied physicists, physicists, semiconductor physicists, and libraries looking to be on the cutting edge of methods to analyze electromagnetic behavior of materials, Material Characterization using Electron Holography offers comprehensive coverage of the subject from authoritative and forward-thinking topical experts.
Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.
This book discusses the direct imaging of electric and magnetic fields of various functional materials using electron holography, providing indispensable information for understanding their electromagnetic properties. In order to clearly demonstrate the principles of this cutting-edge technology, easy-to-understand explanations are accompanied by numerous illustrations and figures throughout the book. The book highlights the dynamic nature of electromagnetic fields in novel materials, as revealed by changing temperature, or applying electric current and magnetic fields. Furthermore, it showcases, as a new development of the technique, the direct observation of accumulation and collective motion of electrons around charged insulators. Clear experimental data on electromagnetic fields and the motions of electrons help the reader understand their importance in materials science and fundamental physics. Seeing is believing!
Daisuke Suzuki presents a gripping true crime narrative that delves into the training and operations of young scammers in Japan, revealing their connections with organized crime. His account includes vivid portrayals of the scammers he personally interviewed, and highlights the societal tensions in Japan between the younger and older generations that contribute to this scam’s prevalence. The overall effect is nothing short of thrilling.
In this revealing study, Daisuke Miyao explores "the aesthetics of shadow" in Japanese cinema in the first half of the twentieth century. This term, coined by the production designer Yoshino Nobutaka, refers to the perception that shadows add depth and mystery. Miyao analyzes how this notion became naturalized as the representation of beauty in Japanese films, situating Japanese cinema within transnational film history. He examines the significant roles lighting played in distinguishing the styles of Japanese film from American and European film and the ways that lighting facilitated the formulation of a coherent new Japanese cultural tradition. Miyao discusses the influences of Hollywood and German cinema alongside Japanese Kabuki theater lighting traditions and the emergence of neon commercial lighting during this period. He argues that lighting technology in cinema had been structured by the conflicts of modernity in Japan, including capitalist transitions in the film industry, the articulation of Japanese cultural and national identity, and increased subjectivity for individuals. By focusing on the understudied element of film lighting and treating cinematographers and lighting designers as essential collaborators in moviemaking, Miyao offers a rereading of Japanese film history.
DIVCritical biography of Sessue Hayakawa, a Japanese actor who became a popular silent film star in the U.S., that looks at how Hollywood treated issues of race and nationality in the early twentieth century./div
High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.
Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.
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