Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents a comprehensive analysis of EOS/ESD-related failures in I/O protection devices in integrated circuits. The design of I/O protection circuits has been done in a hit-or-miss way due to the lack of systematic analysis tools and concrete design guidelines. In general, the development of on-chip protection structures is a lengthy expensive iterative process that involves tester design, fabrication, testing and redesign. When the technology is changed, the same process has to be repeated almost entirely. This can be attributed to the lack of efficient CAD tools capable of simulating the device behavior up to the onset of failure which is a 3-D electrothermal problem. For these reasons, it is important to develop and use an adequate measure of the EOS robustness of integrated circuits in order to address the on-chip EOS protection issue. Fundamental understanding of the physical phenomena leading to device failures under ESD/EOS events is needed for the development of device models and CAD tools that can efficiently describe the device behavior up to the onset of thermal failure. Modeling of Electrical Overstress in Integrated Circuits is for VLSI designers and reliability engineers, particularly those who are working on the development of EOS/ESD analysis tools. CAD engineers working on development of circuit level and device level electrothermal simulators will also benefit from the material covered. This book will also be of interest to researchers and first and second year graduate students working in semiconductor devices and IC reliability fields.
Mexico is an extensive country with an extremely complex mosaic of landscapes. The soils of Mexico have still not been completely studied, and there are few publications available on this subject. This book provides a state-of-the-art view on Mexican soils, their geographical distribution, their use and degradation. This is a first attempt to give a systematized characteristic of the soil resources of Mexico. Land resources of the second-biggest economy in Latin America are critical for its sustainable development, and a demand for adequate soil information is high. The information contained within can be used for any soil-related research done in Mexico and in neighboring countries. The book includes detailed characteristics of soils of all the physiographic regions of Mexico with maps, photos and explanatory schemes. The book is based on the experiences of the authors in research and soil survey, as well as on the existent, mainly ‘grey’ literature on Mexican soils. The book is recommended for researchers and university readers, students of all levels and decision-makers, working in the area of soil science, environmental issues, Earth sciences, land management and nature conservation.
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